System Overview:
The power semiconductor blocking characteristic test bench mainly completes the testing of various parameters for power devices, including repetitive peak off-state voltage (VDRM), repetitive peak reverse voltage (VRRM), DC off-state voltage (VD), and corresponding repetitive peak off-state current (IDRM), repetitive peak reverse current (IRRM), and off-state current (ID).
System Units and Parameter Conditions:
No. | Item | Parameter | Remarks |
1 | Output Voltage 1: AC Half-Wave | Peak 1.0-13kVp, Accuracy <3%, Resolution: 10V, Frequency: 50Hz/5Hz. | |
2 | Output Voltage 2: DC Trapezoidal Wave | Amplitude 1.0-10.00kV, Accuracy <1%, Resolution: 10V, Pulse Width: 5-50ms, Rise Time <2ms. | |
3 | Output Current 1: AC Half-Wave: | Peak 1-500mA, Accuracy <3%, Frequency: 50Hz/5Hz. 0.1-50mA Resolution 0.1mA 50-500mA Resolution 1mA | |
4 | Output Current 2: DC Trapezoidal Wave | Amplitude 1-200mA, Accuracy <1%, Resolution: 1mA, Pulse Width: 5-50ms. 0.1-50mA Resolution 0.1mA 50-500mA Resolution 1mA | |
5 | Protection Current Threshold | 1-500mA | |
6 | Oscilloscope Interface | BNC(V-I) Voltage Attenuation Factor: 1000:1 Current Gain Factor: 1:3 | |
7 | AC Half-Wave Voltage Adjustment Time | 0-AC Half-Wave Peak: 10s |
