Semiconductor IV Characteristic Curve Tester - the digital source meter is from Wuhan Precision Semiconductor Instruments. The Precision source meter supports four-quadrant operation, source and load, wide voltage and current ranges, with a minimum current resolution of 3pA, current from ±30pA to ±3A, voltage from ±90uV to ±300V, and accuracy of 0.03%. It features a 5-inch touch screen with graphical operation, built-in powerful software functions to accelerate user testing, and supports multiple communication methods: RS-232, GPIB, and Ethernet.
Advantages of Precision Source Meter
Simultaneously provides and measures voltage and/or current with high precision;
Synchronous measurement reduces test time
Provides and measures a very wide range of current and voltage;
Voltage test range ±90uV to ±300V, current test range ±30pA to ±3A
Supports running user script programs without computer control, improving production test speed;
Sequence testing simplifies operation and reduces cost
Uses a user-friendly graphical interface, easy to use regardless of user experience;
Touch screen operation
Compared with traditional power supplies:
Power supply crossing zero requires changing wire connections;
Requires repeated switching of mechanical switches, reducing equipment reliability
Voltage and current limiting accuracy is limited;
Voltage 1%, current 10mA
Compared with power supply combined with multimeter:
Multimeter and power supply combination requires programming for device control and synchronization;
Complex wiring and programming development
Power supply has poor voltage and current limiting performance
Low limiting accuracy and transient characteristics cannot be guaranteed
Integrates the functions of five instruments into one
1. Voltage source
2. Current source
3. Voltmeter
4. Ammeter
5. Electronic load
Semiconductor IV Characteristic Curve Tester Application Fields
Discrete device characteristic testing: resistors, diodes, LEDs, Zener diodes, PIN diodes, BJT transistors, MOSFETs, SiC, GaN, and other devices;
Energy and efficiency characteristic testing: LED/AMOLED, solar cells, batteries, DC/DC converters;
Sensor characteristic testing: resistivity, Hall effect, etc.;
Organic material characteristic testing: electronic ink, printed electronics, etc.;
Nanomaterial characteristic testing: graphene, nanowires, etc.;
Laser characteristic testing: narrow pulse LIV test system;
Power devices: static test system;
Current sensors: dynamic and static parameter test system;
Wuhan Precision Semiconductor Digital Source Meter Application Solutions:
Diode IV testing, laser diode LIV testing, transistor and MOSFET IV testing, APD tube IV testing, solar panel characteristic parameter testing, battery charge/discharge characteristic parameter testing, 2D material IV scanning testing, electrochemical cyclic voltammetry testing;
Additional Functions of Wuhan Precision Semiconductor Digital Source Meter (Implemented via Software):
Diode IV scanning and parameter analysis, transistor IV scanning and parameter analysis, LIV test system, solar cell discharge test system, battery charge/discharge cycling system, etc.;
