Features of the Semiconductor Electrical Characteristics Test System IV+CV Tester:
30μV-1200V, 1pA-100A wide range test capability;
High measurement accuracy, up to 0.03% accuracy across the full range;
Built-in standard device test programs for direct invocation, making testing simple;
Automatic real-time parameter extraction, data plotting, and analysis functions;
Quick switching between CV and IV measurements without rewiring;
Provides flexible fixture customization solutions with strong compatibility;
Free host computer software and SCPI command set;
Typical Applications:
Analysis of nano, flexible, and other material characteristics;
Diodes;
MOSFETs, BJTs, transistors, IGBTs;
Third-generation semiconductor materials/devices;
Organic OFET devices;
LEDs, OLEDs, optoelectronic devices;
Semiconductor resistive and other sensors;
Laser diodes such as EEL, VCSEL, PD, APD;
Resistivity coefficient and Hall effect measurements;
Solar cells;
Non-volatile memory devices;
Failure analysis;
System Technical Specifications
Ordering Information
Modular Architecture
Low-Voltage DC I-V Source Measure Unit
-Accuracy 0.1% or 0.03% selectable
-DC operating mode
-Maximum voltage 300V, maximum DC current 1A or 3A selectable
-Minimum current resolution 10pA
-Four-quadrant operating range
-Supports two-wire and four-wire test modes
-Supports GUARD protection
Low-Voltage Pulse I-V Source Measure Unit
-Accuracy 0.1% or 0.03% selectable
-DC and pulse operating modes
-Maximum voltage 300V, maximum DC current 1A or 3A selectable, maximum pulse current 10A or 30A selectable
-Minimum current resolution 1pA
-Minimum pulse width 200μs
-Four-quadrant operating range
-Supports two-wire and four-wire test modes
-Supports GUARD protection
High-Voltage I-V Source Measure Unit
-Accuracy 0.1%
-Maximum voltage 1200V, maximum DC current 100mA
-Minimum current resolution 100pA
-First and third quadrant operating range
-Supports two-wire and four-wire test modes
-Supports GUARD protection
High-Current I-V Source Measure Unit
-Accuracy 0.1%
-DC and pulse operating modes
-Maximum voltage 100V, maximum DC current 30A, maximum pulse current 100A
-Minimum current resolution 10pA
-Minimum pulse width 80μs
-Four-quadrant operating range
-Supports two-wire and four-wire test modes
-Supports GUARD protection
Capacitance-Voltage C-V Measurement Unit
-Basic accuracy 0.5%
-Test frequency 10Hz~1MHz, optional up to 10MHz
-Supports high-voltage DC bias, maximum bias voltage 1200V
-Multi-functional AC performance testing, C-V, C-f, C-t
Hardware Specifications - IV Testing
Characterization of semiconductor materials and devices often includes electrical parameter testing. Most semiconductor material and device parameter tests include current-voltage (I-V) measurements. The Source Measure Unit (SMU), with four-quadrant, multi-range, and four-wire measurement support, can be used to output and detect high-precision, weak electrical signals, making it an important tool for semiconductor I-V characteristic testing. The SPA-6100 is equipped with various SMUs of different specifications, such as low-voltage DC SMU, low-voltage pulse SMU, and high-current SMU. Users can flexibly configure different specifications and quantities based on testing needs to balance test efficiency and cost.
Flexible and Customizable Fixture Solutions
For semiconductor devices of various package types on the market, Precision offers a complete set of fixture solutions. The fixtures feature low impedance, simple installation, and a wide variety, suitable for testing discrete devices and modules such as diodes, transistors, field-effect transistors, IGBTs, SiC MOSFETs, GaN, etc.; they can also be connected to probe stations for wafer-level chip testing.
Probe Station Connection Diagram
The SPA-6100 Semiconductor Electrical Characteristics Test System IV+CV Tester is a semiconductor electrical characteristics test system independently developed and meticulously crafted by Wuhan Precision. It offers advantages such as high precision, wide measurement range, fast and flexible operation, and strong compatibility. The product supports simultaneous testing of DC current-voltage (I-V), capacitance-voltage (C-V), and pulsed I-V characteristics under high current and high voltage, aiming to accelerate frontier material research, semiconductor chip device design, and advanced process development, with excellent measurement efficiency and reliability.
Based on a modular architecture design, the SPA-6100 Semiconductor Parameter Analyzer helps users flexibly configure measurement units for upgrades based on testing needs. The product supports measurements up to 1200V voltage, 100A high current, and 1pA low current resolution, while also detecting multi-frequency AC capacitance measurements in the range of 10kHz to 1MHz. The SPA-6100 Semiconductor Parameter Analyzer is equipped with Precision's self-developed dedicated semiconductor parameter test software, supporting interactive manual operation or automatic operation with probe stations, enabling efficient and repeatable device characterization from measurement setup, execution, result analysis to data management; it can also be used with temperature chambers and temperature control modules to meet high and low temperature testing requirements.
