Semiconductor characteristic tester IV curve scanner - choose Precision Instruments. We have launched the SXXB series high-precision digital source meters with higher accuracy and larger DC current. Compared to traditional S-series source meters, accuracy is improved to ±0.03%, and DC current is upgraded to 3A, providing more precise and stable test solutions for the semiconductor industry.
Advantages of S-type digital source meter applications:
1. Broad adaptability for multi-functional measurement needs, with voltage up to 300V and current as low as 30pA;
2. Simultaneous "source" output and "meter" measurement to improve test efficiency.
3. Protection function for test devices, with self-limiting capability to avoid damage caused by overcharging;
Precise voltage and current limiting functions provide comprehensive device protection to prevent damage.
4. Touchscreen graphical operation for ease of use. Open platform allows for targeted software development based on actual application needs.
Product Features
5-inch 800*480 touch display, fully graphical operation
Built-in powerful function software to accelerate user testing, such as LIV, PIV
Source and measurement accuracy of 0.03%
Four-quadrant operation (source and sink), source and measurement range: up to 300V, down to 3pA
Rich scanning modes, supporting linear sweep, exponential sweep, and user-defined sweep
USB storage support, one-click export of test reports
Multiple communication methods supported: RS-232, GPIB, and Ethernet
Technical Parameters
Maximum output power: 30W, 4-quadrant source or sink mode;
Source limits: Voltage source: ±10V (≤3A range), ±30V (≤1A range), ±300V (≤100mA range);
Current source: ±3.15A (≤10V range), ±1.05A (≤30V range), ±105mA (≤300V range);
Overrange: 105% of range, source and measurement;
Stable load capacitance: <22nF;
Broadband noise (20MHz): 2mV RMS (typical), <20mV Vp-p (typical);
Cable guard voltage: output impedance 30KΩ, output voltage offset <80uV;
Maximum sampling rate: 1000 S/s;
Trigger: supports IO trigger input and output, trigger polarity configurable;
Output interface: front and rear panel banana jack outputs, only one panel interface can be used at a time;
Communication ports: RS-232, GPIB, Ethernet;
Power: AC 100~240V 50/60Hz;
Operating environment: 25±10℃;
Dimensions: 106mm H × 255mm W × 425mm L;
S-Series Source Meter Applications
Discrete device characteristic testing: resistors, diodes, LEDs, Zener diodes, PIN diodes, BJT transistors, MOSFETs, SiC, GaN, and other devices;
Energy and efficiency characteristic testing: LED/AMOLED, solar cells, batteries, DC/DC converters;
Sensor characteristic testing: resistivity, Hall effect, etc.;
Organic material characteristic testing: electronic ink, printed electronics, etc.;
Nanomaterial characteristic testing: graphene, nanowires, etc.;
Laser characteristic testing: narrow pulse LIV test system;
Power devices: static test system;
Current sensors: dynamic and static parameter test system;
